Authors: 1Nancy Ma | Eric J. Miller | Vincent F. Jones | Kris J. Kozaczek
Moxtek, Inc., 452 W 1260 N, Orem, UT 84057
Email: nma@moxtek.com
Abstract
During the operation of a high-voltage x-ray device, high voltage stresses increase risk of dielectric breakdown. It is critically important that these systems are designed so that the magnitude of the electric field or the electric field stress are within the material limits for dielectric breakdown. In the present investigation, a simplified x-ray device is numerically modelled for two limiting cases with sharp edges and with perfectly-rounded edges to understand the numerical behavior of these solutions and to determine optimal geometry for minimizing electric field stress.
Keywords: Electric Field Singularities; Electric Field Stress; Electrostatics; High Voltage; Numerical Modelling; X-Ray
